• Hast Highly Accelerated Stress Testing Chamber for Semiconductors
  • Hast Highly Accelerated Stress Testing Chamber for Semiconductors
  • Hast Highly Accelerated Stress Testing Chamber for Semiconductors
  • Hast Highly Accelerated Stress Testing Chamber for Semiconductors
  • Hast Highly Accelerated Stress Testing Chamber for Semiconductors
  • Hast Highly Accelerated Stress Testing Chamber for Semiconductors

Hast Highly Accelerated Stress Testing Chamber for Semiconductors

After-sales Service: 24 Hours on Line Services
Power Supply: 220V
Certification: CE, ISO
Warranty: 1 Year
Diameter: 350/550mm
Depth: 450/650mm
Customization:
Manufacturer/Factory & Trading Company

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Guangdong, China
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  • Overview
  • Product Description
  • Product Parameters
  • Product Application
  • Company Profile
  • Packaging & Shipping
Overview

Basic Info.

Model NO.
HAST
Temperature Range
+105ºC~+135ºC
Humidity Range(Unsaturation Control)
65%Rh to 100%
Humidity Range(Saturation Control )
100%Rh
Pressurization Time
Normal Pressure ~200kpa Within 20 Min
Transport Package
Strong Plywood Case, Meet International Standards
Specification
Standard and Customized available
Trademark
KOMEG
Origin
Dongguan, China
HS Code
90321000
Production Capacity
1000 Sets Per Year

Product Description


HAST Highly Accelerated Stress Testing Chamber for Semiconductors

 
Product Description


HAST Chamber, also known as Highly Accelerated Stress Test Chamber, integrates high temperature, high humidity and high pressure. This newly designed HAST chamber is a new product officially launched by KOMEG in 2023. 

Smaller size
Safe design
Reduce test time
Test microchip and semiconductors
Meets multiple testing standards
Available in different capacities
Accept customization

 
Product Parameters
Model No. KM-HAST-35 KM-HAST-55
Interior Size (mm) Diameter(Φ) 350 550
Depth(D) 450 650
Exterior Size (mm) Width(W) 730 1150
Height(H) 1630 1550
Depth(D) 1100 1400
Temperature range  +105ºC~+135ºC
Humidity range 65%RH to 100%(Unsaturation control)
100%RH (Saturation control )
Pressure range 0.05~0.3MPa
Gauge pressure: +0.2~200kPa
Absolute pressure: 100 ~ 300kPa
Temperature fluctuation ± 0.5°C
Temperature uniformity  3.0°C
Temperature deviation  ±3.0°C
Humidity fluctuation ±3.0% RH
Humidity deviation ±5.0% RH
Pressure deviation  ±2kPa
Heating up rate  ±25ºC~+135ºC within 45 min
(average in whole process) ( no-load,no heating)
Pressurization time Normal Pressure ~200kPa within 20 min
Power supply  220V AC 1Ø 50Hz
Noise ≤68dB (1 meter distance from the door)
Safety protection device NFB(No fuse breaker), over pressure, over heat and over current protectors for compressor, over temperature protectors, over load protector of fan, dry heat protector,short of water protector
 
Product Application

Hast Highly Accelerated Stress Testing Chamber for Semiconductors

Company Profile


Hast Highly Accelerated Stress Testing Chamber for Semiconductors

Hast Highly Accelerated Stress Testing Chamber for Semiconductors
Packaging & Shipping

Hast Highly Accelerated Stress Testing Chamber for Semiconductors

Hast Highly Accelerated Stress Testing Chamber for Semiconductors


 

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