• Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing
  • Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing
  • Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing
  • Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing
  • Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing
  • Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing

Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing

After-sales Service: AC380V ,AC220V 50Hz
Power Supply: AC380V ,AC220V 50Hz
Certification: CE, ISO
Warranty: 1 Year
Inner Dimension: Diameter 550 mm*D (Depth) 650mm
Outer Dimension: About W900 mm*H1552 mm*D1500 mm
Customization:
Manufacturer/Factory & Trading Company

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Guangdong, China
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ISO9001:2015 certificate
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Basic Info.

Model NO.
hast-55
Device Cooling Method
Natural Cooling or Air Purging Type
Temp. Range
105c~135c(at 100% Relative Humidity)
Humidity Range
Std Saturation Test Mode: 100%Rh
Pressure Range
Gauge Pressure: +0.2 ~ 200kpa
Standards Complied
IEC-60068-2-66
Inside Material
SUS316 Stainless Steel Plate
Transport Package
by Plywood Case
Specification
Ø 550 mm*D650mm
Trademark
KOMEG
Origin
China
HS Code
90321000
Production Capacity
6000PCS/Year

Product Description

PCT High Pressure Accelerated Aging Test Mahcine for Semi Conductor Reliability Testing

Product description

The purpose of the Highly Accelerated Aging Test (HAST) is to increase product environmental stress (such as temperature) and working stress (voltage, load, etc. applied to the product), speed up the test process, and shorten the life test time of the product or system. , The reliability of semiconductor products has improved. At present, most electronic devices can withstand long-term high temperature and high humidity deviation tests without failure. Therefore, the test time used to determine the quality of the finished product has also increased a lot. In the design stage of the product, it is used to quickly expose the defects and weaknesses of the product, and test the sealing and aging performance of its products.

Volume and dimension

Volume About 55L
Interior size Ø550 mm*D650mm(Drum type pressure inner box)
  Exterior size W900 mm*H1552mm*D1500 mm(Excluding the protruding part of the machine!)
Tips: For external dimensions, please confirm the three views according to the final design!

The main technical parameters

 Test Conditions Cool method: :Natural cooling or air purging
Measured at a room temperature of +25 ºC under no load, Measured at normal pressure 101.3Kpa, the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5 or IEC60068 -3; the sensor is placed at the air outlet of the air handling unit.
 Temperature range +105ºC~+135ºC(At 100% relative humidity)
Temp.  fluctuation ±0.5ºC
Temp. uniformity ≤±3.0ºC
Temp. deviation ≤±3.0ºC
  Humidity range 1) HUM unsaturated test mode: 65~100%RH
2) STD saturation test mode: 100%RH
 Humidity Fluctuation ±3.0%RH
 Humidity Deviation ±5.0%RH
 Temperature change rate Heat up rate:
 +25ºC~+135ºC, full range average speed  approx 45 min (no-load,no heating)
Load no
  Note:Measured at a room temperature of +25 ºC under no load,the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5 or IEC60068 -3; the sensor is placed at the air outlet of the air handling unit.
  Pressure range Gauge pressure: +0.2 ~ 200Kpa
*Absolute pressure: 100 ~ 300Kpa
  Pressure deviation ≤±2 kPa
  Pressure rise time Atmospheric pressure to 200Kpa   20min

Features:
The industry's first application of fluid simulation design technology and product process manufacturing technology, the product is more energy-efficient.
The inner tank adopts a double-layer arc design, which can prevent the phenomenon of condensation and dripping in the test, so as to avoid the direct impact of the superheated steam on the product in the test process and affect the test result.
Fully automatic water replenishment function, front-mounted water level confirmation.
(Attached table)

Test conditions Temperature Humidity Duration Remark
JEDE-22-A102 121ºC 100%R.H. 168h Other duration:
24h, 48h, 96h, 168h, 240h, 336h
IPC-FC-241B-PCB tensile strength test of copper laminate 121ºC 100%R.H. 100h Copper laminate strength: 1000N/m
IC auto clave testing 121ºC 100%R.H. 288h  
Low dielectric high heat resistance multilayer board 121ºC 100%R.H. 192h  
PCB plugging agent 121ºC 100%R.H. 192h  
PCB-PCT test 121ºC 100%R.H. 30min Lamination, bubble, white dot
Lead free soldering accelerated aging test 1 121ºC 100%R.H. 8h Equivalent to 6 months high temp high humidity, activation energy: 4.44ev
Lead free soldering accelerated aging test 2 121ºC 100%R.H. 16h Equivalent to 12 months high temp high humidity, activation energy: 4.44ev
IC lead free aging test 121ºC 100%R.H. 1000h Check at every 500h
Flat panel tightness test 121ºC 100%R.H. 12h  
Metallic gasket 121ºC 100%R.H. 24h  
IC packaging test 121ºC 100%R.H. 500h, 1000h  
PCB moisture absorb test 121ºC 100%R.H. 5h, 8h  
FPC moisture absorb test 121ºC 100%R.H. 192h  
PCB plugging agent 121ºC 100%R.H. 192h  
Low dielectric high heat resistance multilayer material 121ºC 100%R.H. 5h Water absorption less than 0.4-0.6%
High Tg glass epoxy multilayer PCB material 121ºC 100%R.H. 5h Water absorption less than 0.55-0.65%
High Tg glass epoxy multilayer PCB material
Heat resistance of reflow welding after moisture absorption
121ºC 100%R.H. 3h  
Co-bra Bond 121ºC 100%R.H. 168h  
Automotive PCB 121ºC 100%R.H. 50h, 100h  
Mainboard PCB 121ºC 100%R.H. 30min  
GBA board 121ºC 100%R.H. 24h  
IC accelerated moisture resistance test 121ºC 100%R.H. 8h  

Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing
Pct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability TestingPct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability TestingPct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability TestingPct High Pressure Accelerated Aging Test machine for Semi Conductor Reliability Testing

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